Advances in Biometrics: International Conference, ICB 2006, Hong Kong, China, January 5-7, 2006. Proceedings
- Author
- Kieron Messer, Josef Kittler, James Short, G. Heusch, Fabien Cardinaux (auth.), David Zhang, Anil K. Jain (eds.)
- Publisher
- Springer-Verlag Berlin Heidelberg
- Language
- English
- Edition
- 1
- Year
- 2005
- Page
- 798
- ISBN
- 978-3-540-31111-9,978-3-540-31621-3
- File Type
- pdf
- File Size
- 15.6 MiB
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