Secondary Ion Mass Spectrometry SIMS IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13–19, 1983
- Author
- P. Sigmund (auth.), Professor Dr. A. Benninghoven, Professor Dr. J. Okano, Professor Dr. R. Shimizu, Dr. H. W. Werner (eds.)
- Publisher
- Springer-Verlag Berlin Heidelberg
- Language
- English
- Edition
- 1
- Year
- 1984
- Page
- 506
- ISBN
- 978-3-642-82258-2,978-3-642-82256-8
- File Type
- pdf
- File Size
- 12.7 MiB
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