Point Defects in Semiconductors II: Experimental Aspects
- Author
- Dr. Jacques Bourgoin, Dr. Michel Lannoo (auth.)
- Publisher
- Springer-Verlag Berlin Heidelberg
- Language
- English
- Edition
- 1
- Year
- 1983
- Page
- 295
- ISBN
- 978-3-642-81834-9,978-3-642-81832-5
- File Type
- pdf
- File Size
- 9.3 MiB
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