Automated Technology for Verification and Analysis: 5th International Symposium, ATVA 2007 Tokyo, Japan, October 22–25, 2007 Proceedings

Author
Nathan Whitehead, Jordan Johnson, Martín Abadi (auth.), Kedar S. Namjoshi, Tomohiro Yoneda, Teruo Higashino, Yoshio Okamura (eds.)
Publisher
Springer-Verlag Berlin Heidelberg
Language
English
Edition
1
Year
2007
Page
570
ISBN
3540755950,9783540755951
File Type
pdf
File Size
6.1 MiB

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