Fault Diagnosis and Tolerance in Cryptography: Third International Workshop, FDTC 2006, Yokohama, Japan, October 10, 2006. Proceedings
- Author
- Shay Gueron, Jean-Pierre Seifert (auth.), Luca Breveglieri, Israel Koren, David Naccache, Jean-Pierre Seifert (eds.)
- Publisher
- Springer-Verlag Berlin Heidelberg
- Language
- English
- Edition
- 1
- Year
- 2006
- Page
- 258
- ISBN
- 3540462503,9783540462507
- File Type
- pdf
- File Size
- 2.5 MiB
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