X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987

Author: D. Sayre, M. Howells, J. Kirz, H. Rarback (auth.), David Sayre Ph. D., Professor Janos Kirz Ph. D., Malcolm Howells Ph. D., Harvey Rarback Ph. D. (eds.)
Publisher: Springer-Verlag Berlin Heidelberg
Language: English
Edition: 1
Year: 1988
Page: 455
ISBN: 978-3-662-14490-9,978-3-540-39246-0
File Type: pdf
File Size: 17.3 MiB

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