New Developments in Lie Theory and Their Applications
- Author
- Nolan R. Wallach (auth.), Juan Tirao, Nolan R. Wallach (eds.)
- Publisher
- Birkhäuser Basel
- Language
- English
- Edition
- 1
- Year
- 1992
- Page
- 228
- ISBN
- 978-1-4612-7743-9,978-1-4612-2978-0
- File Type
- pdf
- File Size
- 9.9 MiB
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