Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces
- Author
- Professor Dr. Gerd Kaupp (auth.)
- Publisher
- Springer-Verlag Berlin Heidelberg
- Language
- English
- Edition
- 1
- Year
- 2006
- Page
- 292
- ISBN
- 978-3-540-28405-5,978-3-540-28472-7
- File Type
- pdf
- File Size
- 25.9 MiB
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