Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
- Author
- Kipp van Schooten (auth.)
- Publisher
- Springer International Publishing
- Language
- English
- Edition
- 1
- Year
- 2013
- Page
- 90
- ISBN
- 978-3-319-00589-8,978-3-319-00590-4
- File Type
- pdf
- File Size
- 2.1 MiB
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