Accelerated Testing: Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics)
- Author
- Wayne B. Nelson
- Publisher
- Wiley-Interscience
- Language
- English
- Edition
- 1
- Year
- 2004
- Page
- 610
- ISBN
- 9780470316795,0470316799
- File Type
- pdf
- File Size
- 31.8 MiB
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