Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits - The System on Chip Approach
- Author
- Sun, Yichuang(eds.)
- Publisher
- Institution of Engineering and Technology
- Language
- English
- Year
- 2008
- Page
- 404
- ISBN
- 978-1-61583-315-3,978-0-86341-745-0
- File Type
- pdf
- File Size
- 5.5 MiB
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