Helium Ion Microscopy: Principles and Applications
- Author
- David C. Joy (auth.)
- Publisher
- Springer-Verlag New York
- Language
- English
- Edition
- 1
- Year
- 2013
- Page
- 64
- ISBN
- 978-1-4614-8659-6,978-1-4614-8660-2
- File Type
- pdf
- File Size
- 1.8 MiB
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