Applied Logistic Regression
- Author
- David W. Hosmer, Stanley Lemeshow, Rodney X. Sturdivant (auth.), Walter A. Shewhart, Samuel S. Wilks (eds.)
- Publisher
- Wiley
- Language
- English
- Edition
- 3rd
- Year
- 2013
- Page
- 528
- ISBN
- 9780470582473,9781118548387,0470582472
- File Type
- pdf
- File Size
- 4.7 MiB
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