Scanning Probe Microscopy for Industrial Applications : Nanomechanical Characterization
- Author
- Dalia G Yablon
- Publisher
- Wiley
- Year
- 2013
- Page
- 385 p.
- ISBN
- 9781118723142,1118723147,978-1-118-28823-8
- File Type
- pdf
- File Size
- 20.7 MiB
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