Trace-Based Post-Silicon Validation for VLSI Circuits
- Author
- Xiao Liu, Qiang Xu (auth.)
- Publisher
- Springer International Publishing
- Language
- English
- Edition
- 1
- Year
- 2014
- Page
- 108
- ISBN
- 978-3-319-00532-4,978-3-319-00533-1
- File Type
- pdf
- File Size
- 2.6 MiB
How to Download?!!!
Just click on START button on Telegram Bot