Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
- Author
- David H. Krinsley, Kenneth Pye, Sam Boggs Jr, N. Keith Tovey
- Publisher
- Cambridge University Press
- Language
- English
- Year
- 2005
- Page
- 204
- ISBN
- 0521019745,9780521019743
- File Type
- pdf
- File Size
- 69.4 MiB
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