Data-driven Methods for Fault Detection and Diagnosis in Chemical Processes
- Author
- Evan L. Russell PhD, Leo H. Chiang MS, Richard D. Braatz PhD (auth.)
- Publisher
- Springer-Verlag London
- Language
- English
- Edition
- 1
- Year
- 2000
- Page
- 192
- ISBN
- 978-1-4471-1133-7,978-1-4471-0409-4
- File Type
- pdf
- File Size
- 8.6 MiB
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