Ultrafast Phenomena in Semiconductors
- Author
- Torsten Meier, Peter Thomas, Stephan W. Koch (auth.), Kong-Thon Tsen (eds.)
- Publisher
- Springer-Verlag New York
- Language
- English
- Edition
- 1
- Year
- 2001
- Page
- 507
- ISBN
- 978-1-4612-6562-7,978-1-4613-0203-2
- File Type
- pdf
- File Size
- 17.1 MiB
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