Noise in Semiconductor Devices: Modeling and Simulation
- Author
- Dr. Fabrizio Bonani, Prof. Giovanni Ghione (auth.)
- Publisher
- Springer-Verlag Berlin Heidelberg
- Language
- English
- Edition
- 1
- Year
- 2001
- Page
- 213
- ISBN
- 978-3-642-08586-4,978-3-662-04530-5
- File Type
- pdf
- File Size
- 7.0 MiB
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