Product Integrity and Reliability in Design
- Author
- John W. Evans, Jillian Y. Evans, Dong-su Ryu (auth.), John W. Evans, Jillian Y. Evans (eds.)
- Publisher
- Springer-Verlag London
- Language
- English
- Edition
- 1
- Year
- 2001
- Page
- 402
- ISBN
- 978-1-4471-1065-1,978-1-4471-0253-3
- File Type
- pdf
- File Size
- 15.1 MiB
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