Pattern Recognition and Machine Learning: Proceedings of the Japan—U.S. Seminar on the Learning Process in Control Systems, held in Nagoya, Japan August 18–20, 1970

Author
Kokichi Tanaka (auth.), K. S. Fu (eds.)
Publisher
Springer US
Language
English
Edition
1
Year
1971
Page
344
ISBN
978-1-4615-7568-9,978-1-4615-7566-5
File Type
pdf
File Size
7.7 MiB

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