Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications: 16th Iberoamerican Congress, CIARP 2011, Pucón, Chile, November 15-18, 2011. Proceedings

Author
Robert P. W. Duin, Elżbieta Pȩkalska (auth.), César San Martin, Sang-Woon Kim (eds.)
Publisher
Springer-Verlag Berlin Heidelberg
Language
English
Edition
1
Year
2011
Page
721
ISBN
978-3-642-25084-2,978-3-642-25085-9
File Type
pdf
File Size
19.1 MiB

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