Value Analysis Tear-down - A New Process for Product Development and Innovation
- Author
- Sato, YoshihikoKaufman, J. Jerry
- Publisher
- Industrial Press
- Language
- English
- Year
- 2005
- Page
- 213
- ISBN
- 978-1-61583-609-3,978-0-470-09772-4,0-8311-3203-5
- File Type
- pdf
- File Size
- 8.8 MiB
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