Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications
- Author
- Manuel Servin, J. Antonio Quiroga, Moises Padilla
- Publisher
- John Wiley & Sons, Inc
- Language
- English
- Year
- July 2014
- Page
- 345
- File Type
- pdf
- File Size
- 5.6 MiB
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