New Horizons in Testing. Latent Trait Test Theory and Computerized Adaptive Testing
- Author
- David J. Weiss
- Publisher
- Elsevier Inc, Academic Press
- Language
- English
- Edition
- 1
- Year
- 1983
- Page
- 345
- ISBN
- 978-0-12-742780-5,0127427805
- File Type
- pdf
- File Size
- 16.9 MiB
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