Design and Test Technology for Dependable Systems-on-Chip
- Author
- Ubar, RaimundRaik, JaanVierhaus, Heinrich Theodor
- Publisher
- IGI Global
- Year
- 2011
- Page
- 579
- ISBN
- 978-1-62198-976-9,978-1-46662-839-7,978-1-60960-212-3,978-1-60960-214-7
- File Type
- pdf
- File Size
- 23.3 MiB
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