Trace-based post-silicon validation for VLSI circuits
- Author
- Xiao Liu, Qiang Xu (auth.)
- Publisher
- Springer International Publishing
- Language
- English
- Edition
- 1
- Year
- 2014
- Page
- 108
- ISBN
- 9783319005331,3319005332
- File Type
- pdf
- File Size
- 5.0 MiB
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