Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
- Author
- Sandeep K. Goel, Krishnendu Chakrabarty
- Publisher
- CRC Press
- Language
- English
- Edition
- 1
- Year
- 2013
- Page
- 259
- ISBN
- 978-1-4398-2942-4,978-1-4398-2941-7
- File Type
- pdf
- File Size
- 20.2 MiB
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