Phase Change Memory: Device Physics, Reliability and Applications
- Author
- Andrea Redaelli (eds.)
- Publisher
- Springer International Publishing
- Language
- English
- Edition
- 1
- Year
- 2018
- Page
- XVIII, 330
- ISBN
- 978-3-319-69052-0,978-3-319-69053-7
- File Type
- pdf
- File Size
- 15.2 MiB
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