Circuit Design for Reliability

Circuit Design for Reliability

Author
Ricardo Reis, Yu Cao, Gilson Wirth (eds.)
Publisher
Springer-Verlag New York
Language
English
Edition
1
Year
2015
Page
272
ISBN
978-1-4614-4077-2,978-1-4614-4078-9
File Type
pdf
File Size
11.7 MiB

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

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