Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy
- Author
- Bert Voigtländer (auth.)
- Publisher
- Springer-Verlag Berlin Heidelberg
- Language
- English
- Edition
- 1
- Year
- 2015
- Page
- 382
- ISBN
- 978-3-662-45239-4, 978-3-662-45240-0
- File Type
- pdf
- File Size
- 14.1 MiB
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