Advanced Transmission Electron Microscopy: Applications to Nanomaterials

Author
Francis Leonard Deepak, Alvaro Mayoral, Raul Arenal (eds.)
Publisher
Springer International Publishing
Language
English
Edition
1
Year
2015
Page
272
ISBN
978-3-319-15176-2,978-3-319-15177-9
File Type
pdf
File Size
12.6 MiB

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