Value analysis tear-down : a new process for product development and innovation
- Author
- Kaufman, J. JerrySato, Yoshihiko
- Publisher
- Industrial Press, Society of Manufacturing Engineers
- Language
- English
- Edition
- 1st ed
- Year
- 2005
- Page
- 206
- ISBN
- 0-8311-3203-5,9780831132033,9781615835799,1615835792
- File Type
- pdf
- File Size
- 8.8 MiB
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