Electrical Characterisation of Ferroelectric Field Effect Transistors Based on Ferroelectric HfO2 Thin Films
- Author
- Ekaterina Yurchuk
- Publisher
- Logos Verlag Berlin
- Language
- English
- Edition
- 1
- Year
- 2015
- Page
- 186
- ISBN
- 9783832594787,9783832540036
- File Type
- pdf
- File Size
- 3.0 MiB
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