Quantum Metrology, Imaging, and Communication

Quantum Metrology, Imaging, and Communication

Author
David S. Simon, Gregg Jaeger, Alexander V. Sergienko (auth.)
Publisher
Springer International Publishing
Language
English
Edition
1
Year
2017
Page
XII, 273
ISBN
978-3-319-46551-7,978-3-319-46549-4
File Type
pdf
File Size
6.1 MiB

This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.

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