Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience
- Author
- Jian Min Zuo, John C.H. Spence (auth.)
- Publisher
- Springer-Verlag New York
- Language
- English
- Edition
- 1
- Year
- 2017
- Page
- XXVI, 729
- ISBN
- 978-1-4939-6607-3,978-1-4939-6605-9
- File Type
- pdf
- File Size
- 26.7 MiB
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