Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings
- Author
- Antonio Robles-Kelly, Marco Loog, Battista Biggio, Francisco Escolano, Richard Wilson (eds.)
- Publisher
- Springer International Publishing
- Language
- English
- Edition
- 1
- Year
- 2016
- Page
- XIII, 588
- ISBN
- 978-3-319-49054-0,978-3-319-49055-7
- File Type
- pdf
- File Size
- 52.0 MiB
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