Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS
- Author
- Gracieli Posser, Sachin S. Sapatnekar, Ricardo Reis (auth.)
- Publisher
- Springer International Publishing
- Language
- English
- Edition
- 1
- Year
- 2017
- Page
- XX, 118
- ISBN
- 978-3-319-48898-1, 978-3-319-48899-8
- File Type
- pdf
- File Size
- 4.9 MiB
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