Spectroscopic ellipsometry : practical application to thin film characterization
- Author
- Hilfiker, James N.Tompkins, Harland G
- Publisher
- Momentum Press
- Language
- English
- Year
- 2016
- Page
- 178
- ISBN
- 1606507273,978-1-60650-727-8,978-1-60650-728-5
- File Type
- pdf
- File Size
- 23.3 MiB
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