Data-Driven Fault Detection for Industrial Processes: Canonical Correlation Analysis and Projection Based Methods
- Author
- Zhiwen Chen (auth.)
- Publisher
- Springer Vieweg
- Language
- English
- Edition
- 1
- Year
- 2017
- Page
- XIX, 112
- ISBN
- 978-3-658-16755-4, 978-3-658-16756-1
- File Type
- pdf
- File Size
- 3.8 MiB
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