Metrology and standardization of nanotechnology : protocols and industrial innovations
- Author
- Fujita, DaisukeKaiser, Debra L.Mansfield, ElisabethVoorde, Marcel H
- Language
- English
- Year
- 2017
- ISBN
- 978-3-527-80005-6,3527800050,978-3-527-80030-8,3527800301,978-3-527-34039-2,978-3-527-80029-2,978-3-527-69998-8
- File Type
- pdf
- File Size
- 45.2 MiB
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