Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization
- Author
- Nicolas Brodusch,Hendrix Demers,Raynald Gauvin (auth.)
- Publisher
- Springer Singapore
- Language
- English
- Edition
- 1
- Year
- 2018
- Page
- XII, 137
- ISBN
- 978-981-10-4432-8, 978-981-10-4433-5
- File Type
- pdf
- File Size
- 7.1 MiB
How to Download?!!!
Just click on START button on Telegram Bot