Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy

Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy

Author
Oku, Takeo
Publisher
De Gruyter
Language
English
Year
2014
Page
178
ISBN
9783110304725,3110304724,9783110305012,3110305011,9783110388046,3110388049
File Type
pdf
File Size
15.1 MiB

High-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes.

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