VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers
- Author
- Brajesh Kumar Kaushik,Sudeb Dasgupta,Virendra Singh (eds.)
- Publisher
- Springer Singapore
- Language
- English
- Edition
- 1
- Year
- 2017
- Page
- XXI, 815
- ISBN
- 978-981-10-7469-1,978-981-10-7470-7
- File Type
- pdf
- File Size
- 96.5 MiB
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