Thermal-Aware Testing of Digital VLSI Circuits and Systems
- Author
- Santanu Chattopadhyay
- Publisher
- CRC Press
- Language
- English
- Edition
- 1
- Year
- 2018
- Page
- 138
- ISBN
- 9780815378822,9781351227780,0815378823,9781351227766,1351227769,9781351227773,1351227777
- File Type
- pdf
- File Size
- 5.0 MiB
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