Fundamentals of Electromigration-Aware Integrated Circuit Design
- Author
- Jens Lienig,Matthias Thiele (auth.)
- Publisher
- Springer International Publishing
- Language
- English
- Edition
- 1
- Year
- 2018
- Page
- XIII, 159
- ISBN
- 978-3-319-73557-3, 978-3-319-73558-0
- File Type
- pdf
- File Size
- 5.5 MiB
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