Thermal-aware testing of digital VLSI circuits and systems
- Author
- Chattopadhyay, Santanu
- Language
- English
- Edition
- First edition
- Year
- 2018
- ISBN
- 9780815378822,0815378823,9781351227780,1351227785
- File Type
- pdf
- File Size
- 1.3 MiB
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