Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings
- Author
- Xiao Bai, Edwin R. Hancock, Tin Kam Ho, Richard C. Wilson, Battista Biggio, Antonio Robles-Kelly
- Publisher
- Springer International Publishing
- Language
- English
- Edition
- 1st ed.
- Year
- 2018
- Page
- XIII, 524
- ISBN
- 978-3-319-97784-3;978-3-319-97785-0
- File Type
- pdf
- File Size
- 37.0 MiB
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