Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials
- Author
- Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert
- Publisher
- Springer International Publishing
- Language
- English
- Edition
- 3rd ed.
- Year
- 2018
- Page
- XXI, 321
- ISBN
- 978-3-319-99824-4,978-3-319-99825-1
- File Type
- pdf
- File Size
- 12.4 MiB
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