VLSI Design and Test: 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
- Author
- S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh
- Publisher
- Springer Singapore
- Language
- English
- Edition
- 1st ed.
- Year
- 2019
- Page
- XVIII, 722
- ISBN
- 978-981-13-5949-1,978-981-13-5950-7
- File Type
- pdf
- File Size
- 86.9 MiB
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